Events: upcoming

Masterclass & Facility Opening: FIB-SEM/AFM

30 Sep - 1 Oct 2025 The University of Sydney

Join us at Microscopy Australia’s new Sydney Microscopy & Microanalysis (SMM) Engineering Node for a two-day masterclass series combining both theory and practical hands-on sessions, led by experts from SMM, academia, and industry.

The workshops are designed to build skills in advanced microscopy techniques, with a focus on biological and materials science applications. They aim to upskill researchers and facility staff in operating, maintaining, and calibrating these instruments for advanced applications. There will be specific applications given throughout the workshop, but there will be plenty of opportunities to ask questions and interact with experts in the field.

The two-day event will open with the official launch of the SMM Engineering Node, including a keynote from internationally recognised leader and pioneer in High-Speed AFM, Professor Toshio Ando.

Event details

When: 30 September (10am-5pm) – 1 October 2025 (9am-4pm)
Where: 
Engineering and Technology Precinct (J03), The University of Sydney
Cost: $75 for the two-day program. Includes morning tea, lunch and afternoon tea.

Day 1: Tuesday 30 September

10 am-1.30 pm

SMM Engineering Node Launch and Keynote

Official Node launch, morning tea, keynote from Professor Toshio Ando and lunch.

1.30 pm-5 pm

Theory Workshop

An in-depth introduction to AFM specialising in Biological or Materials or FIB sample preparation, covering core principles, current capabilities, maintenance and calibration.

 

Day 2: Wednesday 1 October

9 am-4 pm

You’ll be able to choose one of the workshop streams below.

Biological AFM Workshop
Topics include:

• AFM fundamentals and history

• Basic modes and quantitative AFM

• Sample preparation and practical tips

• Tissue/cell biomechanics

• High-speed Bio-AFM

Materials AFM Workshop
Topics include:

• AFM fundamentals and history

• Basic modes and quantitative AFM

• Sample preparation and practical tips

• Conductive AFM IV curve

• PFM (Piezo Force Microscopy)

• KPFM (Kelvin Probe Force Microscopy)

FIB Sample Preparation for TEM and APT
Topics include:

• FIB fundamentals

• Ion sample interactions

• TEM preparation

• APT preparation

• Advanced preparation techniques

REGISTER HERE