FIB SIG User Group Meeting

Join us for the first FIB SIG user group meeting and discover the world of Focused Ion Beam systems (FIB). Get inspired by FIB supported research in Australia and across the globe.

• Hui Diao h.diao1@uq.edu.au
• Annalena Wolff awolff@caltech.edu
• Mitchell Nancarrow nancarro@uow.edu.au
• Anders Barlow anders.barlow@unimelb.edu.au

The FIB SIG is looking forward to receiving abstracts on research supported by FIB technology including but not limited to APT and TEM lamella preparation, cross-sectioning, nanofabrication, 3D tomography, FIB technique development, Ga FIB, Xe PFIB, Helium Ion Microscopy, FIB for sample preparation, research supported by FIB technology, additive manufacturing, FIB-SIMS, correlative workflows involving FIB, cryo FIB.

Zoom link will be sent to registered participants on Thursday 23rd September.